Pour/Cloud Point Testers MPC-102A/102L

TANAKA’s MPC series has been designed for automatic determination of POUR POINT (PP) and CLOUD POINT (CP) with small specimen size and shorter test cycle time while securing better test precision than the conventional manual methods.

PP measurement is by “AIR PRESSURE METHOD” (ASTM D6749), and CP measurement is by “SMALL TEST JAR METHOD” (ASTM D7683).

The epoch-making automatic PP test method yields 1°C test resolution, while the new CP method yields 0.1°C resolution.


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MPC-102A MPC-102L
Test Methods PP: ASTM D6749, ASTM D97, ISO 3016 / CP: ASTM D7683, ASTM D2500, ISO 3015
Type Bench top, 1poshion, with air cooled Peltier cooler Bench top, 1position, with liquid cooled Peltier cooler
Measuring range +51 to -25°C in 25°C ambient +51 to -65°C when used with 1set of TCU-40B chiller (opt)
Display VFD module VFD module
Ext. port RS-232C RS-232C
Size 230(W) × 480(D) × 385(H) mm 230(W) × 480(D) × 385(H) mm
Weight 19kg 19kg
Power cons. 500W 500W

Principle of Pour Point Detection