TANAKA’s MPC series has been designed for automatic determination of POUR POINT (PP) and CLOUD POINT (CP) with small specimen size and shorter test cycle time while securing better test precision than the conventional manual methods.
PP measurement is by “AIR PRESSURE METHOD” (ASTM D6749), and CP measurement is by “SMALL TEST JAR METHOD” (ASTM D7683).
The epoch-making automatic PP test method yields 1°C test resolution, while the new CP method yields 0.1°C resolution.
|Test Methods||PP: ASTM D6749, ASTM D97, ISO 3016 / CP: ASTM D7683, ASTM D2500, ISO 3015|
|Type||Bench top, 1poshion, with air cooled Peltier cooler||Bench top, 1position, with liquid cooled Peltier cooler|
|Measuring range||+51 to -25°C in 25°C ambient||+51 to -65°C when used with 1set of TCU-40B chiller (opt)|
|Display||VFD module||VFD module|
|Size||230(W) × 480(D) × 385(H) mm||230(W) × 480(D) × 385(H) mm|
Principle of Pour Point Detection